Memory effect by charging of ultra-small 2-nm laser-synthesized solution processable Si-nanoparticles embedded in Si–Al2O3–SiO2structure [Phys. Status Solidi A 212, 1751–1755 (2015)] (Appl. Phys. Lett., (2014), 104, (13112), 10.1002/pssa.201431802)

Nazek El-Atab, Ayman Rizk, Burak Tekcan, Sabri Alkis, Ali K. Okyay, Ammar Nayfeh

Research output: Contribution to journalComment/debate

1 Scopus citations

Abstract

The authors would like to make an addition to the caption of Fig. 1, notifying partly reused material from another journal. We would like to add the following in the caption of Fig. 1: Partly reused from N. El-Atab et al., Appl. Phys. Lett. 104, 013112 (2014) [4].

Original languageBritish English
Pages (from-to)2264
Number of pages1
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume213
Issue number8
DOIs
StatePublished - 1 Aug 2016

Keywords

  • atomic layer deposition
  • charge trapping memory
  • laser processing
  • metal–oxide–semiconductor structures
  • nanoparticles
  • silicon

Fingerprint

Dive into the research topics of 'Memory effect by charging of ultra-small 2-nm laser-synthesized solution processable Si-nanoparticles embedded in Si–Al2O3–SiO2structure [Phys. Status Solidi A 212, 1751–1755 (2015)] (Appl. Phys. Lett., (2014), 104, (13112), 10.1002/pssa.201431802)'. Together they form a unique fingerprint.

Cite this