Measurement of the fundamental parameters for the film-rupture/oxidation mechanism - The effect of chromium
- S. A. Attanasio
- , J. S. Fish
- , W. W. Wilkening
- , P. M. Rosecrans
- , D. S. Morton
- , G. S. Was
- , Y. Yi
- Lockheed Martin Corporation
- University of Michigan, Ann Arbor
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
16
Scopus
citations