Lifetime Investigation of DC-link Capacitors in Multiple Slim Drives System

Shili Huang, Haoran Wang, DInesh Kumar, Guorong Zhu, Huai Wang

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    This paper studies the reliability of DC-Link capacitor in multiple slim drives system. In order to obtain the electro-thermal stress of capacitor in individual drive simply and accurately, a time-efficient equivalent model and its analytical model for multiple slim drives system is proposed. Based on the proposed equivalent circuit model and the existing lifetime prediction method, the impact of drive numbers on the reliability of DC-link capacitor in multiple slim drives is analyzed. The results serve as a guideline for capacitor sizing in multiple slim drives system from reliability aspect.

    Original languageBritish English
    Title of host publication2019 IEEE 15th Brazilian Power Electronics Conference and 5th IEEE Southern Power Electronics Conference, COBEP/SPEC 2019
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781728141800
    DOIs
    StatePublished - Dec 2019
    Event15th IEEE Brazilian Power Electronics Conference and 5th IEEE Southern Power Electronics Conference, COBEP/SPEC 2019 - Santos, Brazil
    Duration: 1 Dec 20194 Dec 2019

    Publication series

    Name2019 IEEE 15th Brazilian Power Electronics Conference and 5th IEEE Southern Power Electronics Conference, COBEP/SPEC 2019

    Conference

    Conference15th IEEE Brazilian Power Electronics Conference and 5th IEEE Southern Power Electronics Conference, COBEP/SPEC 2019
    Country/TerritoryBrazil
    CitySantos
    Period1/12/194/12/19

    Keywords

    • adjustable speed drive
    • DC-Link capacitor
    • lifetime
    • multiple slim drives

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