Josephson junctions with periodic defects: Ic(H) characteristics

N. Lazarides

doi:10.1103/PhysRevB.68.092506

Josephson junctions with periodic defects: I_c(H) characteristics

N. Lazarides

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Abstract

A simple analytical expression of the I_c(H) characteristics of Josephson junctions with thick periodic defects is obtained within the uniform field approximation. The analytical I_c(H), captures the important qualitative features seen in experiments, and completes the physical picture described by the current-blocking model. Due to its simplicity, it may be used to fit experimental data.

Original language	British English
Journal	Physical Review B-Condensed Matter
Volume	68
Issue number	9
DOIs	https://doi.org/10.1103/PhysRevB.68.092506
State	Published - 2003

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title = "Josephson junctions with periodic defects: Ic(H) characteristics",

abstract = "A simple analytical expression of the Ic(H) characteristics of Josephson junctions with thick periodic defects is obtained within the uniform field approximation. The analytical Ic(H), captures the important qualitative features seen in experiments, and completes the physical picture described by the current-blocking model. Due to its simplicity, it may be used to fit experimental data.",

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AB - A simple analytical expression of the Ic(H) characteristics of Josephson junctions with thick periodic defects is obtained within the uniform field approximation. The analytical Ic(H), captures the important qualitative features seen in experiments, and completes the physical picture described by the current-blocking model. Due to its simplicity, it may be used to fit experimental data.

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JO - Physical Review B-Condensed Matter

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IS - 9

ER -

Josephson junctions with periodic defects: I_c(H) characteristics

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