Investigation on the short-circuit behavior of an aged IGBT module through a 6 kA/1.1 kV non-destructive testing equipment

Rui Wu, Liudmila Smirnova, Francesco Iannuzzo, Huai Wang, Frede Blaabjerg

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    10 Scopus citations

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    Engineering