Investigation of radiation effects on the properties of organic semiconductors using low-dose TEM analysis

Research output: Contribution to journal › Article › peer-review

Original language	British English
Pages (from-to)	1436-1437
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612009038
State	Published - Jul 2012

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@article{9b7631e9ddfe4d76953c6e2e9f78873a,

title = "Investigation of radiation effects on the properties of organic semiconductors using low-dose TEM analysis",

author = "Anjum, \{Dalaver H.\} and Rachid Sougrat and Z. Kui and A. Amassian",

year = "2012",

month = jul,

doi = "10.1017/S1431927612009038",

language = "British English",

volume = "18",

pages = "1436--1437",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Investigation of radiation effects on the properties of organic semiconductors using low-dose TEM analysis

AU - Anjum, Dalaver H.

AU - Sougrat, Rachid

AU - Kui, Z.

AU - Amassian, A.

PY - 2012/7

Y1 - 2012/7

UR - https://www.scopus.com/pages/publications/85007967123

U2 - 10.1017/S1431927612009038

DO - 10.1017/S1431927612009038

M3 - Article

AN - SCOPUS:85007967123

SN - 1431-9276

VL - 18

SP - 1436

EP - 1437

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -