Influence of the growth parameters on the electrical properties of thin polycrystalline CVD diamond films

C. Jany, A. Tardieu, A. Gicquel, P. Bergonzo, F. Foulon

    Research output: Contribution to journalConference articlepeer-review

    37 Scopus citations

    Abstract

    We report here results concerning significant improvement achieved in the growth of electronic grade chemically vapour deposited diamond films used for the fabrication of radiation detectors. We especially focused on the optimization of the carrier mobility and lifetime in thin (20 μm) undoped polycrystalline diamond films. Deposition temperature, methane concentration and microwave power density were systematically varied in order to establish deposition processes that provide adequate materials for alpha particle detection. Raman spectroscopy and scanning electron microscopy were used to probe the intrinsic quality of the films in term of solid state structure and purity. The electrical properties of the films were deduced from current-voltage characteristics and from the measurements of diamond detectors sensitivity to alpha particle irradiation (E = 5.5 MeV). Significant correlation was observed between the physico-chemical characteristics (crystallography quality by Raman line width, and purity by the qualitative ratio Isp(2)/Isp(3), nitrogen content) and electrical properties (resistivity, carrier mobility lifetime product) of sets of 20 μm thick films. In addition, at given growth parameters, the effect of diamond film thickness on their electrical properties was studied.

    Original languageBritish English
    Pages (from-to)1086-1090
    Number of pages5
    JournalDiamond and Related Materials
    Volume9
    Issue number3
    DOIs
    StatePublished - 2000
    Event10th European Conference on Diamond, Diamond-like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide - Prague, Czech Republic
    Duration: 12 Sep 199917 Sep 1999

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