Influence of defect inhomogeneities in high quality natural diamond detectors

D. Tromson; V. N. Amosov; A. Brambilla; C. Mer; F. Foulon; R. Barrett; P. Bergonzo

doi:10.1016/S0925-9635(00)00607-5

Influence of defect inhomogeneities in high quality natural diamond detectors

D. Tromson
, V. N. Amosov
, A. Brambilla
, C. Mer
, F. Foulon
, R. Barrett
, P. Bergonzo

Centre d'Etudes Nucléaires de Saclay
Troitsk Institute for Innovation and Fusion Research
European Synchrotron Radiation Facility

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

The presence of impurities in natural diamond detectors and their influence on the detection properties have been investigated. A micrometer size X-ray beam generated by a synchrotron light source as well as collimated alpha particles were used to probe the effects induced by non isotropic distributions of defects on diamond detector characteristics. A strong correlation clearly appears between the measured photocurrent maps and the X-ray induced luminescence pictures. Spatially resolved alpha measurements are compared to local infrared and ultraviolet absorption measurements and demonstrate the influence of defects on local and global diamond detection spectra.

Original language	British English
Pages (from-to)	469-473
Number of pages	5
Journal	Diamond and Related Materials
Volume	10
Issue number	3-7
DOIs	https://doi.org/10.1016/S0925-9635(00)00607-5
State	Published - Mar 2001

Keywords

Mirco beam analysis
Radiation detectors
Traps and defects

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@article{ff2363195ff1402caa90b69e84153928,

title = "Influence of defect inhomogeneities in high quality natural diamond detectors",

abstract = "The presence of impurities in natural diamond detectors and their influence on the detection properties have been investigated. A micrometer size X-ray beam generated by a synchrotron light source as well as collimated alpha particles were used to probe the effects induced by non isotropic distributions of defects on diamond detector characteristics. A strong correlation clearly appears between the measured photocurrent maps and the X-ray induced luminescence pictures. Spatially resolved alpha measurements are compared to local infrared and ultraviolet absorption measurements and demonstrate the influence of defects on local and global diamond detection spectra.",

keywords = "Mirco beam analysis, Radiation detectors, Traps and defects",

author = "D. Tromson and Amosov, \{V. N.\} and A. Brambilla and C. Mer and F. Foulon and R. Barrett and P. Bergonzo",

year = "2001",

month = mar,

doi = "10.1016/S0925-9635(00)00607-5",

language = "British English",

volume = "10",

pages = "469--473",

journal = "Diamond and Related Materials",

issn = "0925-9635",

publisher = "Elsevier B.V.",

number = "3-7",

}

TY - JOUR

T1 - Influence of defect inhomogeneities in high quality natural diamond detectors

AU - Tromson, D.

AU - Amosov, V. N.

AU - Brambilla, A.

AU - Mer, C.

AU - Foulon, F.

AU - Barrett, R.

AU - Bergonzo, P.

PY - 2001/3

Y1 - 2001/3

N2 - The presence of impurities in natural diamond detectors and their influence on the detection properties have been investigated. A micrometer size X-ray beam generated by a synchrotron light source as well as collimated alpha particles were used to probe the effects induced by non isotropic distributions of defects on diamond detector characteristics. A strong correlation clearly appears between the measured photocurrent maps and the X-ray induced luminescence pictures. Spatially resolved alpha measurements are compared to local infrared and ultraviolet absorption measurements and demonstrate the influence of defects on local and global diamond detection spectra.

AB - The presence of impurities in natural diamond detectors and their influence on the detection properties have been investigated. A micrometer size X-ray beam generated by a synchrotron light source as well as collimated alpha particles were used to probe the effects induced by non isotropic distributions of defects on diamond detector characteristics. A strong correlation clearly appears between the measured photocurrent maps and the X-ray induced luminescence pictures. Spatially resolved alpha measurements are compared to local infrared and ultraviolet absorption measurements and demonstrate the influence of defects on local and global diamond detection spectra.

KW - Mirco beam analysis

KW - Radiation detectors

KW - Traps and defects

UR - https://www.scopus.com/pages/publications/0035269393

U2 - 10.1016/S0925-9635(00)00607-5

DO - 10.1016/S0925-9635(00)00607-5

M3 - Article

AN - SCOPUS:0035269393

SN - 0925-9635

VL - 10

SP - 469

EP - 473

JO - Diamond and Related Materials

JF - Diamond and Related Materials

IS - 3-7

ER -

Influence of defect inhomogeneities in high quality natural diamond detectors

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Keywords

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