Influence of defect inhomogeneities in high quality natural diamond detectors

D. Tromson, V. N. Amosov, A. Brambilla, C. Mer, F. Foulon, R. Barrett, P. Bergonzo

    Research output: Contribution to journalArticlepeer-review

    3 Scopus citations

    Abstract

    The presence of impurities in natural diamond detectors and their influence on the detection properties have been investigated. A micrometer size X-ray beam generated by a synchrotron light source as well as collimated alpha particles were used to probe the effects induced by non isotropic distributions of defects on diamond detector characteristics. A strong correlation clearly appears between the measured photocurrent maps and the X-ray induced luminescence pictures. Spatially resolved alpha measurements are compared to local infrared and ultraviolet absorption measurements and demonstrate the influence of defects on local and global diamond detection spectra.

    Original languageBritish English
    Pages (from-to)469-473
    Number of pages5
    JournalDiamond and Related Materials
    Volume10
    Issue number3-7
    DOIs
    StatePublished - Mar 2001

    Keywords

    • Mirco beam analysis
    • Radiation detectors
    • Traps and defects

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