Abstract
The presence of impurities in natural diamond detectors and their influence on the detection properties have been investigated. A micrometer size X-ray beam generated by a synchrotron light source as well as collimated alpha particles were used to probe the effects induced by non isotropic distributions of defects on diamond detector characteristics. A strong correlation clearly appears between the measured photocurrent maps and the X-ray induced luminescence pictures. Spatially resolved alpha measurements are compared to local infrared and ultraviolet absorption measurements and demonstrate the influence of defects on local and global diamond detection spectra.
Original language | British English |
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Pages (from-to) | 469-473 |
Number of pages | 5 |
Journal | Diamond and Related Materials |
Volume | 10 |
Issue number | 3-7 |
DOIs | |
State | Published - Mar 2001 |
Keywords
- Mirco beam analysis
- Radiation detectors
- Traps and defects