Influence of CVD diamond film textures on the electrical response of radiation detectors

C. Jany, F. Foulon, P. Bergonzo, A. Brambilla, A. Gicquel, T. Pochet

    Research output: Contribution to journalArticlepeer-review

    11 Scopus citations


    The influence of the texture of polycrystalline CVD diamond films on their electrical properties was studied. The films were deposited by a microwave-plasma-enhanced chemical vapour deposition technique (MPCVD). (110) and (100) textured films, and non-textured films were produced under different growth conditions. Extensive measurements were carried out in order to probe the electrical properties of the films: resistivity, carrier lifetimes, mobility and carrier drift length before trapping. The influence of nitrogen impurities on the film electrical properties is addressed. CVD diamond detectors were characterised electrically in photo-current mode at room temperature under X-ray radiation at 40 keV. The results give evidence of a strong influence of the texture, nitrogen impurities and polycrystalline structural defects of the films on their use as X-ray detectors.

    Original languageBritish English
    Pages (from-to)107-111
    Number of pages5
    JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    Issue number1-2
    StatePublished - 1 Oct 1996


    Dive into the research topics of 'Influence of CVD diamond film textures on the electrical response of radiation detectors'. Together they form a unique fingerprint.

    Cite this