TY - GEN
T1 - Inclined-plane tests of textured silicone rubber samples
AU - Sarkar, P.
AU - Haddad, A.
AU - Waters, R. T.
AU - Griffiths, H.
AU - Harid, N.
AU - Charalampidis, P.
PY - 2010
Y1 - 2010
N2 - The shank regions of a polluted polymeric insulator are vulnerable to thermal damage from partial arcs. To alleviate this problem, it has recently been proposed to contour the polymeric surface with regular patterns of protuberances in order to reduce both the leakage current density and electric field strength in such regions, and by the same means to achieve an increase in creepage length. The performance in inclinedplane tests of samples prepared with various types of textured pattern, and a range of sizes of hemispherical protuberances, are described, along with results for non-textured plane-surface samples for comparison. A remarkable improvement is achieved by such texturing in the satisfaction of the standard test criteria, and in limiting surface discharge activity and reducing the tracking and erosion of the sample.
AB - The shank regions of a polluted polymeric insulator are vulnerable to thermal damage from partial arcs. To alleviate this problem, it has recently been proposed to contour the polymeric surface with regular patterns of protuberances in order to reduce both the leakage current density and electric field strength in such regions, and by the same means to achieve an increase in creepage length. The performance in inclinedplane tests of samples prepared with various types of textured pattern, and a range of sizes of hemispherical protuberances, are described, along with results for non-textured plane-surface samples for comparison. A remarkable improvement is achieved by such texturing in the satisfaction of the standard test criteria, and in limiting surface discharge activity and reducing the tracking and erosion of the sample.
UR - http://www.scopus.com/inward/record.url?scp=78650595295&partnerID=8YFLogxK
U2 - 10.1109/ICHVE.2010.5640708
DO - 10.1109/ICHVE.2010.5640708
M3 - Conference contribution
AN - SCOPUS:78650595295
SN - 9781424482863
T3 - 2010 International Conference on High Voltage Engineering and Application, ICHVE 2010
SP - 532
EP - 535
BT - 2010 International Conference on High Voltage Engineering and Application, ICHVE 2010
T2 - 2010 International Conference on High Voltage Engineering and Application, ICHVE 2010
Y2 - 11 October 2010 through 14 October 2010
ER -