TY - JOUR
T1 - In situ temperature measurement of a notebook computer - A case study in health and usage monitoring of electronics
AU - Vichare, Nikhil
AU - Rodgers, Peter
AU - Eveloy, Valérie
AU - Pecht, Michael G.
PY - 2004/12
Y1 - 2004/12
N2 - Reliability prediction methods do not generally account for the actual life cycle environment of electronic products, which covers their environmental, operating and usage conditions. Considering thermal loads, thermal management strategies still focus on a design for continuous operation that is often determined based on an accumulation of worst-case assumptions. Health monitoring is a method of assessing the reliability of a product in its actual application conditions. A case study in health and usage monitoring of electronic products is presented for a commercial notebook computer. Internal temperatures were dynamically monitored in situ and statistically analyzed during all phases of the life cycle, including usage, storage, and transportation. The effects of power cycles, usage history, CPU computing resources usage, and external thermal environment on peak transient thermal loads were characterized. Such monitored life cycle temperature data could be applied in a life consumption monitoring methodology, to provide damage estimation and remaining life prediction due to specific failure mechanisms influenced by temperature. These findings could contribute to the design of more sustainable, least-energy consumption thermal management solutions.
AB - Reliability prediction methods do not generally account for the actual life cycle environment of electronic products, which covers their environmental, operating and usage conditions. Considering thermal loads, thermal management strategies still focus on a design for continuous operation that is often determined based on an accumulation of worst-case assumptions. Health monitoring is a method of assessing the reliability of a product in its actual application conditions. A case study in health and usage monitoring of electronic products is presented for a commercial notebook computer. Internal temperatures were dynamically monitored in situ and statistically analyzed during all phases of the life cycle, including usage, storage, and transportation. The effects of power cycles, usage history, CPU computing resources usage, and external thermal environment on peak transient thermal loads were characterized. Such monitored life cycle temperature data could be applied in a life consumption monitoring methodology, to provide damage estimation and remaining life prediction due to specific failure mechanisms influenced by temperature. These findings could contribute to the design of more sustainable, least-energy consumption thermal management solutions.
KW - Electronics cooling
KW - Health monitoring
KW - In situ monitoring
KW - Notebook computer
KW - Reliability prediction
KW - Temperature measurement
KW - Thermal characterization
UR - http://www.scopus.com/inward/record.url?scp=13444256234&partnerID=8YFLogxK
U2 - 10.1109/TDMR.2004.838403
DO - 10.1109/TDMR.2004.838403
M3 - Article
AN - SCOPUS:13444256234
SN - 1530-4388
VL - 4
SP - 658
EP - 663
JO - IEEE Transactions on Device and Materials Reliability
JF - IEEE Transactions on Device and Materials Reliability
IS - 4
ER -