Impact of Mission Profile Dynamics on Accuracy of Thermal Stress Modeling in PV Inverters

Ariya Sangwongwanich, Huai Wang, Frede Blaabjerg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations

    Abstract

    Thermal stress modeling of power devices is a key factor that influences the design for reliability of Photovoltaic (PV) inverters under long-term operations, i.e., different mission profiles. Due to the requirement of long-term analysis for mapping the inverter reliability more accurately, a thermal model based on a lumped thermal network is normally employed due to its low computational burden. However, there is still a lack of validation in terms of modeling accuracy, e.g., comparing the simulation results against the experimental thermal stress in field operations. Besides, the impact of mission profile dynamics on the accuracy of different thermal modeling approaches have not been analyzed. To address this issue, the model accuracy of two thermal stress modeling approaches for PV inverters are evaluated in this paper by comparing the thermal stress estimated from a thermal model with the experimental results under various mission profile dynamics. According to the results, the average error of the junction temperature estimation is 1.51 % for a transient thermal model and 2.08 % for a steady-state thermal model, respectively. On the other hand, the computational efficiency of the thermal stress modeling can be improved by more than a factor of three when using the steady-state thermal model.

    Original languageBritish English
    Title of host publicationECCE 2020 - IEEE Energy Conversion Congress and Exposition
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages5269-5275
    Number of pages7
    ISBN (Electronic)9781728158266
    DOIs
    StatePublished - 11 Oct 2020
    Event12th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2020 - Virtual, Detroit, United States
    Duration: 11 Oct 202015 Oct 2020

    Publication series

    NameECCE 2020 - IEEE Energy Conversion Congress and Exposition

    Conference

    Conference12th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2020
    Country/TerritoryUnited States
    CityVirtual, Detroit
    Period11/10/2015/10/20

    Keywords

    • Insulated-gate bipolar transistor (IGBT)
    • inverters
    • mission profile
    • Photovoltaic (PV) systems
    • reliability
    • thermal modeling

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