Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles

Hongjian Xia, Yi Zhang, Dao Zhou, Minyou Chen, Wei Lai, Yunhai Wei, Huai Wang

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations

    Abstract

    Power loss estimation is an indispensable procedure to conduct lifetime prediction for power semiconductor device. The previous studies successfully perform steady-state power loss estimation for different applications, but which may be limited for the electric vehicles (EVs) with high dynamics. Based on two EV standard driving cycle profiles, this paper gives a comparative study of power loss estimation models with two different time resolutions, i.e., the output period average and the switching period average. The correspondingly estimated power losses, thermal profiles, and lifetime clearly pointed out that the widely applied power loss model with the output period average is limited for EV applications, in particular for the highly dynamic driving cycle. The difference in the predicted lifetime can be up to 300 times due to the unreasonable choice the loss model, which calls for the industry attention on the differences of the EVs and the importance of loss model selection in lifetime prediction.

    Original languageBritish English
    Title of host publicationIECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society
    PublisherIEEE Computer Society
    ISBN (Electronic)9781665480253
    DOIs
    StatePublished - 2022
    Event48th Annual Conference of the IEEE Industrial Electronics Society, IECON 2022 - Brussels, Belgium
    Duration: 17 Oct 202220 Oct 2022

    Publication series

    NameIECON Proceedings (Industrial Electronics Conference)
    Volume2022-October

    Conference

    Conference48th Annual Conference of the IEEE Industrial Electronics Society, IECON 2022
    Country/TerritoryBelgium
    CityBrussels
    Period17/10/2220/10/22

    Keywords

    • electric vehicle
    • lifetime
    • loss model
    • power semiconductor device

    Fingerprint

    Dive into the research topics of 'Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles'. Together they form a unique fingerprint.

    Cite this