TY - GEN
T1 - Impact of lifetime model selections on the reliability prediction of IGBT modules in modular multilevel converters
AU - Zhang, Yi
AU - Wang, Huai
AU - Wang, Zhongxu
AU - Yang, Yongheng
AU - Blaabjerg, Frede
N1 - Publisher Copyright:
© 2017 European Union.
PY - 2017/11/3
Y1 - 2017/11/3
N2 - Power cycling in semiconductor modules contributes to repetitive thermal-mechanical stresses, which in return accumulate as fatigue on the devices, and challenge the lifetime. Typically, lifetime models are expressed in number-of-cycles, within which the device can operate without failures under predefined conditions. In these lifetime models, thermal stresses (e.g., junction temperature variations) are commonly considered. However, the lifetime of power devices involves in cross-disciplinary knowledge. As a result, the lifetime prediction is affected by the selected lifetime model. In this regard, this paper benchmarks the most commonly-employed lifetime models of power semiconductor devices for offshore Modular Multilevel Converters (MMC) based wind farms. The benchmarking reveals that the lifetime model selection has a significant impact on the lifetime estimation. The use of analytical lifetime models should be justified in terms of applicability, limitations, and underlying statistical properties.
AB - Power cycling in semiconductor modules contributes to repetitive thermal-mechanical stresses, which in return accumulate as fatigue on the devices, and challenge the lifetime. Typically, lifetime models are expressed in number-of-cycles, within which the device can operate without failures under predefined conditions. In these lifetime models, thermal stresses (e.g., junction temperature variations) are commonly considered. However, the lifetime of power devices involves in cross-disciplinary knowledge. As a result, the lifetime prediction is affected by the selected lifetime model. In this regard, this paper benchmarks the most commonly-employed lifetime models of power semiconductor devices for offshore Modular Multilevel Converters (MMC) based wind farms. The benchmarking reveals that the lifetime model selection has a significant impact on the lifetime estimation. The use of analytical lifetime models should be justified in terms of applicability, limitations, and underlying statistical properties.
KW - Insulated gate bipolar transistor (IGBT)
KW - Lifetime model
KW - Modular multilevel converter
KW - Power semiconductor module
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=85041413211&partnerID=8YFLogxK
U2 - 10.1109/ECCE.2017.8096728
DO - 10.1109/ECCE.2017.8096728
M3 - Conference contribution
AN - SCOPUS:85041413211
T3 - 2017 IEEE Energy Conversion Congress and Exposition, ECCE 2017
SP - 4202
EP - 4207
BT - 2017 IEEE Energy Conversion Congress and Exposition, ECCE 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2017
Y2 - 1 October 2017 through 5 October 2017
ER -