Impact of 3nm Silicon Nanoparticles on Metal Si Schottky Junctions

Ayman Rezk, Ammar Nayfeh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Surface states in metal-Si interface play a big role in junction and interface physics. In this paper, we studied the impact of 3nm silicon nanoparticles (Si-NPs) at the metal-Si interface under dark and 1 sun conditions. We dispersed the Si-NPs on a clean p-type silicon wafer by drop casting. The nanoparticles formed a nano-layer coating on the Si substrate surface. The associated Schottky junction performance is assessed, and it is found to be different from non-NP's based junction. Moreover, a physical explanation for this behavior is presented and explained.

Original languageBritish English
Title of host publication2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022
PublisherIEEE Computer Society
Pages83-84
Number of pages2
ISBN (Electronic)9781665452250
DOIs
StatePublished - 2022
Event22nd IEEE International Conference on Nanotechnology, NANO 2022 - Palma de Mallorca, Spain
Duration: 4 Jul 20228 Jul 2022

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume2022-July
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Conference

Conference22nd IEEE International Conference on Nanotechnology, NANO 2022
Country/TerritorySpain
CityPalma de Mallorca
Period4/07/228/07/22

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