I-V characteristics of a vertical single Ni nanowire by voltage-applied atomic force microscopy

D. S. Choi, Y. Rheem, B. Yoo, N. V. Myung, Y. K. Kim

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Fingerprint

Dive into the research topics of 'I-V characteristics of a vertical single Ni nanowire by voltage-applied atomic force microscopy'. Together they form a unique fingerprint.

Engineering

Material Science