Abstract
We report a CMOS compatible high-performance ALD Al-doped ZnO thin-film transistor (TFT) fabricated on flexible substrate with a sub-150 °C processing temperature. The TFTs channel are optimized through Al doping (2-3 at.%) using all low-temperature steps to enable flexible substrate processing while minimizing the piezoelectric effect in the channel. The optimized device has an electron mobility as high as 30 cm 2 /Vs in comparison to earlier reported values of 0.1-0.7 cm 2 /Vs for ZnO TFTs while maintaining desired threshold voltages of 1-2 V and I ON/I OFF ratios of 10 7 -10 9 .
| Original language | British English |
|---|---|
| Article number | 8600339 |
| Pages (from-to) | 240-242 |
| Number of pages | 3 |
| Journal | IEEE Electron Device Letters |
| Volume | 40 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2019 |
Keywords
- Atomic layer deposition
- doped zinc oxide
- flexible structures
- piezoelectric films
- thin film transistors
- zinc oxide
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