High performance 4H-SiC emitter coupled logic circuits

Hazem Elgabra, Shakti Singh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The increasing demand for electronic devices and circuits dedicated to harsh environment applications, specifically high temperature and high power, has called for more research dedicated towards silicon carbide (SiC) devices and integrated circuits (ICs). SiC, a wide bandgap semiconductor, is inherently capable of operation in such environments. SiC bipolar transistors unlike MOSFETs, do not have any oxide layer under high electric field, and hence are not prone to reliability issues at high temperatures. In this paper, the design of optimized emitter coupled logic technology circuits using 4H-SiC bipolar transistors is presented. These circuits work over a wide range of temperatures and power supply voltages at high speeds, demonstrating the potential of robust high speed ECL integrated circuits in SiC.

Original languageBritish English
Title of host publication2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages104-105
Number of pages2
ISBN (Print)9781479924523
DOIs
StatePublished - 2013
Event2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013 - Abu Dhabi, United Arab Emirates
Duration: 8 Dec 201311 Dec 2013

Publication series

NameProceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Conference

Conference2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
Country/TerritoryUnited Arab Emirates
CityAbu Dhabi
Period8/12/1311/12/13

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