High Density RRAM Arrays with Improved Thermal and Signal Integrity

  • K. Lahbacha
  • , H. Belgacem
  • , W. Dghais
  • , F. Zayer
  • , Antonio Maffucci

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations

    Abstract

    This paper investigates new solutions for improving the performance of high density Resistive Random-Access Memories (RRAM), based on novel architecture and on the use of alternative materials. Starting from the conventional architecture, which integrates in a crossbar structure many elementary cells composed by one diode and one RRAM (1D1R), here an alternative reverse (1D1R-1R1D) architecture is proposed. This solution doubles the number of cells in a fixed volume and makes more efficient the bias management. An accurate electrothermal modeling is here carried out to check the obtained performance in terms of signal and thermal integrity. The use of the proposed architecture, along with a suitable choice of materials, including novel carbon nanomaterials, can solve or at least mitigate the electrical and thermal crosstalk problems, which are known to be critical for the RRAM crossbar configurations. A case-study is carried out, where a 3×3×4 crossbar structure is analyzed by means of a full 3D electrothermal model.

    Original languageBritish English
    Title of host publicationSPI 2021 - 25th IEEE Workshop on Signal and Power Integrity
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781665423885
    DOIs
    StatePublished - 10 May 2021
    Event25th IEEE Workshop on Signal and Power Integrity, SPI 2021 - Virtual, Online, Germany
    Duration: 10 May 202112 May 2021

    Publication series

    NameSPI 2021 - 25th IEEE Workshop on Signal and Power Integrity

    Conference

    Conference25th IEEE Workshop on Signal and Power Integrity, SPI 2021
    Country/TerritoryGermany
    CityVirtual, Online
    Period10/05/2112/05/21

    Keywords

    • Carbon nanotubes
    • electrothermal models
    • high density integration
    • RRAM
    • signal integrity
    • thermal crosstalk

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