Abstract
A time-domain go/no-go testing strategy for analogue integrated circuit macros is presented. The strategy is based on exciting an analogue macro with a pseudo-random binary sequence and measuring the transient response generated at the external nodes, thereby eliminating the need for intermediate probing. Four methods of analysing the transient response data are discussed. Of these methods, the response digitisation is the most efficient.
Original language | British English |
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Pages (from-to) | 534-540 |
Number of pages | 7 |
Journal | IEE Proceedings, Part G: Circuits, Devices and Systems |
Volume | 139 |
Issue number | 4 |
DOIs | |
State | Published - 1992 |