Go/no-go testing of analogue macros

M. A. Al-Qutayri, P. R. Shepherd

Research output: Contribution to journalArticlepeer-review

19 Scopus citations


A time-domain go/no-go testing strategy for analogue integrated circuit macros is presented. The strategy is based on exciting an analogue macro with a pseudo-random binary sequence and measuring the transient response generated at the external nodes, thereby eliminating the need for intermediate probing. Four methods of analysing the transient response data are discussed. Of these methods, the response digitisation is the most efficient.

Original languageBritish English
Pages (from-to)534-540
Number of pages7
JournalIEE Proceedings, Part G: Circuits, Devices and Systems
Issue number4
StatePublished - 1992


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