Abstract
Cubic GaN films were grown on GaAs(1 0 0) substrates by low-pressure metalorganic vapor-phase epitaxy at high temperature. We have found a nonlinear relation between GaN film thickness and growth time, and this nonlinearity becomes more obvious with increasing growth temperature. We assumed it was because of Ga diffusion through the GaN film, and developed a model which agrees well with the experimental results. These results raise questions concerning the role of Ga diffusion through the GaN film, which may affect the electrical and optical properties of the material.
Original language | British English |
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Pages (from-to) | 646-650 |
Number of pages | 5 |
Journal | Journal of Crystal Growth |
Volume | 191 |
Issue number | 4 |
DOIs | |
State | Published - 1 Aug 1998 |