GA-based system for critical points detection

P. Liatsis; C. Ooi; J. Y. Goulermas

doi:10.1049/el:20062515

GA-based system for critical points detection

P. Liatsis, C. Ooi, J. Y. Goulermas

Electrical Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

A GA-based algorithm for detection of dominant points in closed contours is presented. The proposed scheme aims to simultaneously optimise the number of detected critical points and the approximation error. A new error metric is proposed which takes into account information from the Chamfer image. The performance of the system is shown to be robust to changes in the position, orientation and size of the contour as well as the length of the chromosome.

Original language	British English
Pages (from-to)	1207-1208
Number of pages	2
Journal	Electronics Letters
Volume	42
Issue number	21
DOIs	https://doi.org/10.1049/el:20062515
State	Published - 2006

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@article{e407e72fe5a54e7b87ea10f66aea8c6d,

title = "GA-based system for critical points detection",

abstract = "A GA-based algorithm for detection of dominant points in closed contours is presented. The proposed scheme aims to simultaneously optimise the number of detected critical points and the approximation error. A new error metric is proposed which takes into account information from the Chamfer image. The performance of the system is shown to be robust to changes in the position, orientation and size of the contour as well as the length of the chromosome.",

author = "P. Liatsis and C. Ooi and Goulermas, {J. Y.}",

year = "2006",

doi = "10.1049/el:20062515",

language = "British English",

volume = "42",

pages = "1207--1208",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "John Wiley & Sons Inc.",

number = "21",

}

TY - JOUR

T1 - GA-based system for critical points detection

AU - Liatsis, P.

AU - Ooi, C.

AU - Goulermas, J. Y.

PY - 2006

Y1 - 2006

N2 - A GA-based algorithm for detection of dominant points in closed contours is presented. The proposed scheme aims to simultaneously optimise the number of detected critical points and the approximation error. A new error metric is proposed which takes into account information from the Chamfer image. The performance of the system is shown to be robust to changes in the position, orientation and size of the contour as well as the length of the chromosome.

AB - A GA-based algorithm for detection of dominant points in closed contours is presented. The proposed scheme aims to simultaneously optimise the number of detected critical points and the approximation error. A new error metric is proposed which takes into account information from the Chamfer image. The performance of the system is shown to be robust to changes in the position, orientation and size of the contour as well as the length of the chromosome.

UR - http://www.scopus.com/inward/record.url?scp=33750030755&partnerID=8YFLogxK

U2 - 10.1049/el:20062515

DO - 10.1049/el:20062515

M3 - Article

AN - SCOPUS:33750030755

SN - 0013-5194

VL - 42

SP - 1207

EP - 1208

JO - Electronics Letters

JF - Electronics Letters

IS - 21

ER -

GA-based system for critical points detection

Abstract

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