Fully transparent thin film transistors based on zinc oxide channel layer and molybdenum doped indium oxide electrodes

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Abstract

In this work we report the fabrication of thin film transistors (TFT) with zinc oxide channel and molybdenum doped indium oxide (IMO) electrodes, achieved by room temperature sputtering. A set of devices was fabricated, with varying channel width and length from 5μm to 300μm. Output and transfer characteristics were then extracted to study the performance of thin film transistors, namely threshold voltage and saturation current, enabling to determine optimal fabrication process parameters. Optical transmission in the UV-VIS-IR are also reported.

Original languageBritish English
Title of host publicationAdvances in Display Technologies VI
EditorsMing Hsien Wu, Sin-Doo Lee, Liang-Chy Chien
PublisherSPIE
ISBN (Electronic)9781510600058
DOIs
StatePublished - 2016
EventAdvances in Display Technologies VI - San Francisco, United States
Duration: 18 Feb 2016 → …

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9770
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdvances in Display Technologies VI
Country/TerritoryUnited States
CitySan Francisco
Period18/02/16 → …

Keywords

  • indium molybdenum oxide
  • sputtering
  • thin film transistors
  • zinc oxide

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