Focused ion beam 3D nano-patterned optical fiber tips for advanced beam profile engineering

Ricardo Janeiro, Raquel Flores, Ana R. Ribeiro, Pedro Jorge, Jaime Viegas

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Focused ion beam (FIB) patterning of 3D topography on optical fiber tips for application in stand-alone, rugged and simplified setups for optical tweezers cell sorters, optical near-field lithography and optical beam profile engineering are reported. We demonstrate various configurations based on single-step FIB patterning, multiple-step FIB processing and hybrid approaches based on optical fiber pre- and post-FIB treatment with either etching, fusion splicing, photopolymerization or electroplating steps for optical fiber texture, topography and composition engineering. Different conductive coatings for minimal charge accumulation and beam drift are studied with the relative merits compared. Furthermore optimal beam parameters for accurate pattern replication and positioning are also presented. Measured experimental field profiles are compared with numerical simulations of fabricated optical fiber tips for fabrication accuracy evaluation. Applications employing these engineered fiber tips in the field of optical tweezers, optical vortex generation, photolithography, photo-polymerization and beam forming are presented.

Original languageBritish English
Title of host publicationAdvanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII
EditorsWinston V. Schoenfeld, Georg von Freymann, Raymond C. Rumpf
PublisherSPIE
ISBN (Electronic)9781628414646
DOIs
StatePublished - 2015
EventAdvanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII - San Francisco, United States
Duration: 8 Feb 201511 Feb 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9374
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdvanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII
Country/TerritoryUnited States
CitySan Francisco
Period8/02/1511/02/15

Keywords

  • Diffraction
  • fiber optics
  • Focused ion beam milling
  • Fresnel Zone Plate
  • Photon Sieve

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