Abstract
We report the fabrication of a phase photon sieve (PS) on the tip of a standard single mode fiber by focused ion beam (FIB) milling. The fiber tip was dip-coated with a conductive polymer (PEDOT:PSS) as an alternative, more advantageous method to the metallization prior to FIB milling. The near field scans of the intensity profile along the optical axis under fiber illumination of a laser at λ = 1.55 μm are presented. We have analyzed the focusing properties and demonstrated the validity of our structure for light coupling into silicon photonics waveguides with improved efficiency and alignment tolerance.
Original language | British English |
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Pages (from-to) | 11611-11625 |
Number of pages | 15 |
Journal | Optics Express |
Volume | 24 |
Issue number | 11 |
DOIs | |
State | Published - 30 May 2016 |