Evaluation of Film-Substrate Interface Durability Using a Shaft-Loaded Blister Test

Kin Liao, Kai Tak Wan

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

In this paper, an analytical solution is presented for a shaft-loaded blister test for a thin film-substrate system. Both bending and stretching modes of deformation of the film are considered in the model. It is suggested that film-substrate delamination behavior under a Mode I separation load is governed by a parameter that relates the membrane stress to the rigidity of the film. The delamination behavior of several model thin film-substrate systems under repeated mechanical loads is studied. It is suggested from the results that film-substrate delamination under cyclic load depends on film rigidity, loading frequency, and film-substrate interfacial characteristics.

Original languageBritish English
Pages (from-to)15-20
Number of pages6
JournalJournal of Composites Technology and Research
Volume23
Issue number1
DOIs
StatePublished - Jan 2001

Keywords

  • Blister test
  • Deformation
  • Film-substrate system

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