Enhancing Resilience of DAB Converters with Fault-Tolerant Approach

Piyali Pal, Majid Poshtan, Abdul R. Beig, Ranjan Kumar Behera, Khalifa Al Hosani, Utkal Ranjan Muduli

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The paper examines the dual active bridge (DAB) converter, highlighting its advantages such as adaptable control dimensions, reliable current isolation, high power density, and soft switching capability. Despite these advantages, the DAB converter has vulnerabilities such as stress on capacitors, semiconductor switches, and diodes, making them susceptible to short circuit faults (SCFs) and open-circuit faults (OCFs). SCFs are relatively easier to diagnose and locate but can cause substantial damage if not immediately isolated. In contrast, OCFs are harder to identify and can lead to system shutdowns due to voltage and current distortions. To tackle these issues, the paper analyzes the behavior of the system under eight different faulty switching actions and proposes a specialized fault diagnosis algorithm to avoid false detections. A proactive fault management strategy is proposed to reduce current stress and backflow power under faulty conditions, enhancing the system's resilience. To demonstrate the practicality of the proposed fault-tolerant control strategy, the paper also includes a real-time faulty situation as a case study.

Original languageBritish English
Title of host publication2024 IEEE Applied Power Electronics Conference and Exposition, APEC 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages453-460
Number of pages8
ISBN (Electronic)9798350316643
DOIs
StatePublished - 2024
Event39th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2024 - Long Beach, United States
Duration: 25 Feb 202429 Feb 2024

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
ISSN (Print)1048-2334

Conference

Conference39th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2024
Country/TerritoryUnited States
CityLong Beach
Period25/02/2429/02/24

Keywords

  • Current Stress
  • DAB Converter
  • Fault-tolerant technique
  • Open Circuit fault
  • Reverse Power

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