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Emissivity studies on polycrystalline silicon and a-Si/SiO
2
/Si
W. Chen
, M. Oh
,
S. Abedrabbo
, F. M. Tong
, W. Schmidt
, S. Narayanan
, B. Sopori
, N. M. Ravindra
Physics
New Jersey Institute of Technology
Research output
:
Contribution to journal
›
Conference article
›
peer-review
Overview
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2
/Si'. Together they form a unique fingerprint.
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Engineering
Polysilicon
100%
Silicon Dioxide
100%
Emissivity
100%
Experimental Result
25%
Temperature Range
25%
Silicon Substrate
25%
Developed Computer Program
25%
Room Temperature
25%
Refractive Index
25%
Extinction Coefficient
25%
Refractivity
25%
Physics
Polycrystalline
100%
Emissivity
100%
Computer Program
25%
Refractivity
25%
Room Temperature
25%
Optical Property
25%
Surface Roughness
25%
Material Science
Silicon
100%
Surface (Surface Science)
50%
Optical Property
50%
Refractive Index
50%
Surface Roughness
50%