Electrochemical behavior of copper in post-via-etch cleaning solutions

S. Bilouk, C. Pernel, R. P. Nogueira, L. Broussous, P. H. Haumesser, G. Passemard

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The actions of glycolic acid and BTA on copper have been investigated by electrochemical methods. Different concentrations in glycolic acid were investigated: 1%wt, 2%wt, 3%wt and 4%wt. Results show that the cleaning action of glycolic acid results from smooth corrosion of the metal. Copper dissolution increases with glycolic acid concentration due to the formation of a copper complex which precedes copper dissolution. In the presence of BTA, a corrosion inhibitor of copper, a [Cu(I)BTA] complex is formed on the surface which blocks copper dissolution. In a mixture of glycolic acid and BTA (l%wt/ 0.1%wt), an intermediary behavior is observed. A competitive action occurs between the film formation due to the interaction between BTA and copper and the superficial etching of the metal by glycolic acid which removes the inhibitor-copper film.

Original languageBritish English
Title of host publicationECS Transactions - 10th International Symposium on Semiconductor Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing
Pages395-402
Number of pages8
Edition2
ISBN (Electronic)9781566775687
DOIs
StatePublished - 2007
Event10th International Symposium on Semiconductor Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing - 212th ECS Meeting - Washington, DC, United States
Duration: 7 Oct 200712 Oct 2007

Publication series

NameECS Transactions
Number2
Volume11
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

Conference10th International Symposium on Semiconductor Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing - 212th ECS Meeting
Country/TerritoryUnited States
CityWashington, DC
Period7/10/0712/10/07

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