EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

S. Lilliu, C. Maragliano, M. Hampton, M. Elliott, M. Stefancich, M. Chiesa, M. S. Dahlem, J. E. Macdonald

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the height information. The only required equipment consists of a microscope with lift-mode EFM capable of phase shift detection. We designate this approach as Scanning Probe Potential Electrostatic Force Microscopy (SPP-EFM). An open-source MATLAB Graphical User Interface (GUI) for images acquisition, processing and analysis has been developed. The technique is tested with Indium Tin Oxide (ITO) and with poly(3-hexylthiophene) (P3HT) nanowires for organic transistor applications.

Original languageBritish English
Article number3352
JournalScientific Reports
Volume3
DOIs
StatePublished - 27 Nov 2013

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