Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions

A. Rezk; Y. Abbas; Irfan Saadat; A. Nayfeh; M. Rezeq

doi:10.1149/08903.0133ecst

Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions

A. Rezk
, Y. Abbas
, Irfan Saadat
, A. Nayfeh
, M. Rezeq

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

The localized electrical effect of nanoparticles present in an oxide/semiconductor hetero-junction is investigated by means of Conductive Atomic Force Microscopy (CAFM) and Scanning Kelvin Probe Microscopy (SKPM). This study demonstrates the capability of the sandwiched NPs to modulate the oxide/semiconductor junction in both forward and reverse directions, thus enabling a distinct nano-scale heterojunction. This research, in turn, will contribute to the miniaturization of such NPs based devices in novel applications.

Original language	British English
Title of host publication	Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9
Editors	F. Roozeboom, P. J. Timans, K. Kakushima, E. P. Gusev, Z. Karim, D. Misra, Y. S. Obeng, S. De Gendt, H. Jagannathan
Pages	133-136
Number of pages	4
Edition	3
ISBN (Electronic)	9781607688662, 9781607688686, 9781607688686, 9781607688693, 9781607688709, 9781607688716, 9781607688723
DOIs	https://doi.org/10.1149/08903.0133ecst
State	Published - 2019
Event	International Symposium on Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 - 235th ECS Meeting - Dallas, United States Duration: 26 May 2019 → 30 May 2019

Publication series

Name	ECS Transactions
Number	3
Volume	89
ISSN (Print)	1938-6737
ISSN (Electronic)	1938-5862

Conference

Conference	International Symposium on Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 - 235th ECS Meeting
Country/Territory	United States
City	Dallas
Period	26/05/19 → 30/05/19

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Rezk, A., Abbas, Y., Saadat, I., Nayfeh, A., & Rezeq, M. (2019). Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions. In F. Roozeboom, P. J. Timans, K. Kakushima, E. P. Gusev, Z. Karim, D. Misra, Y. S. Obeng, S. De Gendt, & H. Jagannathan (Eds.), Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 (3 ed., pp. 133-136). (ECS Transactions; Vol. 89, No. 3). https://doi.org/10.1149/08903.0133ecst

Rezk, A. ; Abbas, Y. ; Saadat, Irfan et al. / Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions. Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9. editor / F. Roozeboom ; P. J. Timans ; K. Kakushima ; E. P. Gusev ; Z. Karim ; D. Misra ; Y. S. Obeng ; S. De Gendt ; H. Jagannathan. 3. ed. 2019. pp. 133-136 (ECS Transactions; 3).

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title = "Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions",

abstract = "The localized electrical effect of nanoparticles present in an oxide/semiconductor hetero-junction is investigated by means of Conductive Atomic Force Microscopy (CAFM) and Scanning Kelvin Probe Microscopy (SKPM). This study demonstrates the capability of the sandwiched NPs to modulate the oxide/semiconductor junction in both forward and reverse directions, thus enabling a distinct nano-scale heterojunction. This research, in turn, will contribute to the miniaturization of such NPs based devices in novel applications.",

author = "A. Rezk and Y. Abbas and Irfan Saadat and A. Nayfeh and M. Rezeq",

note = "Publisher Copyright: {\textcopyright} 2019 Electrochemical Society Inc.. All rights reserved.; International Symposium on Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 - 235th ECS Meeting ; Conference date: 26-05-2019 Through 30-05-2019",

year = "2019",

doi = "10.1149/08903.0133ecst",

language = "British English",

series = "ECS Transactions",

number = "3",

pages = "133--136",

editor = "F. Roozeboom and Timans, \{P. J.\} and K. Kakushima and Gusev, \{E. P.\} and Z. Karim and D. Misra and Obeng, \{Y. S.\} and \{De Gendt\}, S. and H. Jagannathan",

booktitle = "Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9",

edition = "3",

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Rezk, A, Abbas, Y, Saadat, I, Nayfeh, A & Rezeq, M 2019, Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions. in F Roozeboom, PJ Timans, K Kakushima, EP Gusev, Z Karim, D Misra, YS Obeng, S De Gendt & H Jagannathan (eds), Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9. 3 edn, ECS Transactions, no. 3, vol. 89, pp. 133-136, International Symposium on Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 - 235th ECS Meeting, Dallas, United States, 26/05/19. https://doi.org/10.1149/08903.0133ecst

Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions. / Rezk, A.; Abbas, Y.; Saadat, Irfan et al.
Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9. ed. / F. Roozeboom; P. J. Timans; K. Kakushima; E. P. Gusev; Z. Karim; D. Misra; Y. S. Obeng; S. De Gendt; H. Jagannathan. 3. ed. 2019. p. 133-136 (ECS Transactions; Vol. 89, No. 3).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Abbas, Y.

AU - Saadat, Irfan

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AU - Rezeq, M.

PY - 2019

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N2 - The localized electrical effect of nanoparticles present in an oxide/semiconductor hetero-junction is investigated by means of Conductive Atomic Force Microscopy (CAFM) and Scanning Kelvin Probe Microscopy (SKPM). This study demonstrates the capability of the sandwiched NPs to modulate the oxide/semiconductor junction in both forward and reverse directions, thus enabling a distinct nano-scale heterojunction. This research, in turn, will contribute to the miniaturization of such NPs based devices in novel applications.

AB - The localized electrical effect of nanoparticles present in an oxide/semiconductor hetero-junction is investigated by means of Conductive Atomic Force Microscopy (CAFM) and Scanning Kelvin Probe Microscopy (SKPM). This study demonstrates the capability of the sandwiched NPs to modulate the oxide/semiconductor junction in both forward and reverse directions, thus enabling a distinct nano-scale heterojunction. This research, in turn, will contribute to the miniaturization of such NPs based devices in novel applications.

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BT - Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9

A2 - Roozeboom, F.

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A2 - Gusev, E. P.

A2 - Karim, Z.

A2 - Misra, D.

A2 - Obeng, Y. S.

A2 - De Gendt, S.

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Rezk A, Abbas Y, Saadat I, Nayfeh A , Rezeq M. Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions. In Roozeboom F, Timans PJ, Kakushima K, Gusev EP, Karim Z, Misra D, Obeng YS, De Gendt S, Jagannathan H, editors, Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9. 3 ed. 2019. p. 133-136. (ECS Transactions; 3). doi: 10.1149/08903.0133ecst

Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions

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