Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions

A. Rezk, Y. Abbas, Irfan Saadat, A. Nayfeh, M. Rezeq

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The localized electrical effect of nanoparticles present in an oxide/semiconductor hetero-junction is investigated by means of Conductive Atomic Force Microscopy (CAFM) and Scanning Kelvin Probe Microscopy (SKPM). This study demonstrates the capability of the sandwiched NPs to modulate the oxide/semiconductor junction in both forward and reverse directions, thus enabling a distinct nano-scale heterojunction. This research, in turn, will contribute to the miniaturization of such NPs based devices in novel applications.

Original languageBritish English
Title of host publicationSilicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9
EditorsF. Roozeboom, P. J. Timans, K. Kakushima, E. P. Gusev, Z. Karim, D. Misra, Y. S. Obeng, S. De Gendt, H. Jagannathan
Pages133-136
Number of pages4
Edition3
ISBN (Electronic)9781607688662, 9781607688686, 9781607688686, 9781607688693, 9781607688709, 9781607688716, 9781607688723
DOIs
StatePublished - 2019
EventInternational Symposium on Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 - 235th ECS Meeting - Dallas, United States
Duration: 26 May 201930 May 2019

Publication series

NameECS Transactions
Number3
Volume89
ISSN (Print)1938-6737
ISSN (Electronic)1938-5862

Conference

ConferenceInternational Symposium on Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 - 235th ECS Meeting
Country/TerritoryUnited States
CityDallas
Period26/05/1930/05/19

Fingerprint

Dive into the research topics of 'Effect of silver nanoparticles on the electrical characteristics of oxide/semiconductor heterojunctions'. Together they form a unique fingerprint.

Cite this