Abstract
In this work the effect of PECVD a-Si growth temperature on the performance of a-Si/c-Si solar cells is studied. Phosphorus doped amorphous silicon was deposited using PECVD at three different temperatures: 150 °C, 200 °C, and 250 °C. A thin film ALD deposited ZnO is used as the anti-reflective coating. Optical and electrical characterization of the samples is carried out, including: ellipsometry, quantum efficiency, reflectance, and current-voltage measurements. Results indicate that cells with emitter layer grown at 200 °C have the highest current density under 1 sun, along with better external quantum efficiency at wavelengths above ∼450 nm.
| Original language | British English |
|---|---|
| Title of host publication | 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1909-1912 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781728104942 |
| DOIs | |
| State | Published - Jun 2019 |
| Event | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States Duration: 16 Jun 2019 → 21 Jun 2019 |
Publication series
| Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
|---|---|
| ISSN (Print) | 0160-8371 |
Conference
| Conference | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 |
|---|---|
| Country/Territory | United States |
| City | Chicago |
| Period | 16/06/19 → 21/06/19 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- aSi
- PECVD
- Silicon
- Solar
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