Abstract
The effect of carbon diffusion on the performance of c-Si HIT cells with aSi1-xCx:H passivation layer is studied. Two HIT cells are fabricated, one with a-Si passivation layer and one with a-SiC layer. SIMS is used to quantify the carbon diffusion into cSi. The results show a significant amount of carbon at the interface and in the c-Si layer. With the carbon diffusion, the Voc, Jsc and fill factor drop from 0.523V to 0.331V, 24 mA/cm2 to 21 mA/cm2 and from 56% to 21% respectively. In addition, the peak EQE drops by 4%. The dark current increases from 6.24×10-4 mA/cm2 to 3.50×10-3 mA/cm2 at V=-0.5V. Moreover, the results indicate that the carbon diffusion reduces the overall c-Si lifetime in addition to increasing the amount of Dit at the interface.
| Original language | British English |
|---|---|
| Title of host publication | 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1197-1200 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781479943982 |
| DOIs | |
| State | Published - 15 Oct 2014 |
| Event | 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States Duration: 8 Jun 2014 → 13 Jun 2014 |
Publication series
| Name | 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 |
|---|
Conference
| Conference | 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 |
|---|---|
| Country/Territory | United States |
| City | Denver |
| Period | 8/06/14 → 13/06/14 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- amorphous materials
- charge carrier lifetime
- photovoltaic cells
- silicon
- silicon carbide
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