Abstract
Diamond polycrystalline films have been synthesized using the Chemical Vapour Deposition (CVD) technique in order to fabricate new types of photo-detectors for novel photon source characterization. We present here diamond-based new devices for a range of applications, including (i) VUV spectral output monitoring down to 125 nm, with high selectivity with respect to UV. These devices exhibit a VUV to UV sensitivity ratio above 400, thus demonstrating their solar blindness. Another aspect (ii) addresses the design of intensity or beam position monitors (resolution <2 μm) for extremely low wavelengths as encountered in synchrotron light source experiments. These detectors enable in-line beam characterization with low cross-section. Further, (iii) since diamond exhibits a low carrier lifetime (≪1 ns), detectors have been fabricated for the temporal characterization of ultra-fast (<100 ps) laser pulse duration monitoring. They can be used for the characterization of short laser pulses as well as for synchrotron machine diagnostics.
| Original language | British English |
|---|---|
| Pages (from-to) | 179-185 |
| Number of pages | 7 |
| Journal | Applied Surface Science |
| Volume | 154 |
| DOIs | |
| State | Published - 1 Feb 2000 |
| Event | The Symposium A on Photo-Excited Processes, Diagnostics and Applications of the 1999 E-MRS Spring Conference (ICPEPA-3) - Strasbourg, France Duration: 1 Jun 1999 → 4 Jun 1999 |