Abstract
Diamond polycrystalline films have been synthesized using the chemical vapour deposition technique in order to fabricate new types of photodetectors for the characterization of X-ray light sources as encountered in synchrotron experiments. We present here new diamond-based devices for three different applications, including (i) semitransparent beam position monitors with high position resolution (<2 μm), (ii) beam profile monitors with 20 μ pitch resolution, and (iii) ultrafast diamond detectors for the 100 ps range that enable the intensity and temporal monitoring of fast X-ray pulses. These devices can be used for in-line characterization of synchrotron beam line experiments as well as for synchrotron machine diagnostics.
| Original language | British English |
|---|---|
| Pages (from-to) | 960-964 |
| Number of pages | 5 |
| Journal | Diamond and Related Materials |
| Volume | 9 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2000 |
| Event | 10th European Conference on Diamond, Diamond-like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide - Prague, Czech Republic Duration: 12 Sep 1999 → 17 Sep 1999 |