Determination of relative concentrations of metallic and semi-conducting SWNTs in suspension via dielectrophoresis

N. Mureau, E. Mendoza, K. F. Hoettges, S. R.P. Silva, M. P. Hughes

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Dielectrophoresis (DEP) is a phemomenon of induced particle motion in non-uniform electric fields. The effect is frequency dependent; by monitoring the motion of particles in AC fields and ananlysing the change in motion with frequency, it is possible to determine the electrical properties of nanoparticles in lab-on-a-chip systems. In this paper, we demonstrate how DEP can be used to determine the ratio of semiconducting and metallic carbon nanotubes in solution, by monitoring the frequency-dependent impedance change between two electrodes as a function of energising frequency.

Original languageBritish English
Title of host publication2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
Pages110-112
Number of pages3
StatePublished - 2006
Event2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings - Boston, MA, United States
Duration: 7 May 200611 May 2006

Publication series

Name2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
Volume1

Conference

Conference2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
Country/TerritoryUnited States
CityBoston, MA
Period7/05/0611/05/06

Keywords

  • Characterisation
  • Chirality
  • Dielectrophoresis
  • Impedance

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