Design for reliability and robustness tool platform for power electronic systems - Study case on motor drive applications

Ionut Vernica, Huai Wang, Frede Blaabjerg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    25 Scopus citations

    Abstract

    Because of the high cost of failure, the reliability performance of power semiconductor devices is becoming a more and more important and stringent factor in many energy conversion applications. Thus, the need for appropriate reliability analysis of the power electronics emerges. Due to its conventional approach, mainly based on failure statistics from the field, the reliability evaluation of the power devices is still a challenging task. In order to address the given problem, a MATLAB based reliability assessment tool has been developed. The Design for Reliability and Robustness (DfR2) tool allows the user to easily investigate the reliability performance of the power electronic components (or sub-systems) under given input mission profiles and operating conditions. The main concept of the tool and its framework are introduced, highlighting the reliability assessment procedure for power semiconductor devices. Finally, a motor drive application is implemented and the reliability performance of the power devices is investigated with the help of the DfR2 tool, and the resulting reliability metrics are presented.

    Original languageBritish English
    Title of host publicationAPEC 2018 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages1799-1806
    Number of pages8
    ISBN (Electronic)9781538611807
    DOIs
    StatePublished - 18 Apr 2018
    Event33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018 - San Antonio, United States
    Duration: 4 Mar 20188 Mar 2018

    Publication series

    NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
    Volume2018-March

    Conference

    Conference33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018
    Country/TerritoryUnited States
    CitySan Antonio
    Period4/03/188/03/18

    Keywords

    • Motor drive system
    • Power semiconductor device
    • Reliability tool
    • System-level reliability

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