Depth resolved luminescence from oriented ZnO nanowires

R. A. Rosenberg, M. Abu Haija, K. Vijayalakshmi, J. Zhou, S. Xu, Z. L. Wang

Research output: Contribution to journalArticlepeer-review

26 Scopus citations


We have utilized the limited penetration depth of x-rays to study the near-surface properties of vertically aligned ZnO nanowires. For an energy of 600 eV the penetration depth varies between 3 and 132 nm as the incidence angle changes from 2° to 33°. Thus, by obtaining optical luminescence spectra as a function of incidence angle, it is possible to probe the near-surface region with nanometer-scale resolution. We will present angle dependent optical luminescence data from oriented ZnO nanowires. By fitting the results to a simple model, we extract a depth for the surface defect regions of ∼14 nm.

Original languageBritish English
Article number243101
JournalApplied Physics Letters
Issue number24
StatePublished - 14 Dec 2009


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