Deposition and characterization of PEDOT/ZnO layers onto PET substrates

M. Garganourakis; S. Logothetidis; C. Pitsalidis; D. Georgiou; S. Kassavetis; A. Laskarakis

doi:10.1016/j.tsf.2009.02.100

Deposition and characterization of PEDOT/ZnO layers onto PET substrates

M. Garganourakis, S. Logothetidis, C. Pitsalidis, D. Georgiou, S. Kassavetis, A. Laskarakis

Physics

Aristotle University of Thessaloniki

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

ZnO thin films of different thicknesses were deposited by pulsed direct-current magnetron sputtering onto poly(ethylene terephthalate) (PET) substrates and afterwards poly 3, 4-ethylenedioxythiophene:polystyrenesulfonate (PEDOT:PSS) was spin-coated onto the ZnO film. Spectroscopic ellipsometry in the Vis-fUV energy range (1.5-6.5 eV), X-ray diffraction and atomic force microscopy were used to reveal the properties of the deposited films. The size of crystallites increased from 5.1 to 7.4 nm, whereas the crystallinity of the ZnO films has been improved. The influence of different ZnO thickness on the optical properties of the PEDOT:PSS layer was studied as well. As the thickness of ZnO films increased, the surface roughness increased but the energy gap decreased after a critical thickness. Concerning the consequences to the PEDOT:PSS optical properties, no major changes occurred in the transition energies.

Original language	British English
Pages (from-to)	6409-6413
Number of pages	5
Journal	Thin Solid Films
Volume	517
Issue number	23
DOIs	https://doi.org/10.1016/j.tsf.2009.02.100
State	Published - 1 Oct 2009

Keywords

Atomic force microscopy
Magnetron sputtering
Optical parameters
PEDOT:PSS
Spectroscopic ellipsometry
X-ray diffraction
ZnO

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10.1016/j.tsf.2009.02.100

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title = "Deposition and characterization of PEDOT/ZnO layers onto PET substrates",

abstract = "ZnO thin films of different thicknesses were deposited by pulsed direct-current magnetron sputtering onto poly(ethylene terephthalate) (PET) substrates and afterwards poly 3, 4-ethylenedioxythiophene:polystyrenesulfonate (PEDOT:PSS) was spin-coated onto the ZnO film. Spectroscopic ellipsometry in the Vis-fUV energy range (1.5-6.5 eV), X-ray diffraction and atomic force microscopy were used to reveal the properties of the deposited films. The size of crystallites increased from 5.1 to 7.4 nm, whereas the crystallinity of the ZnO films has been improved. The influence of different ZnO thickness on the optical properties of the PEDOT:PSS layer was studied as well. As the thickness of ZnO films increased, the surface roughness increased but the energy gap decreased after a critical thickness. Concerning the consequences to the PEDOT:PSS optical properties, no major changes occurred in the transition energies.",

keywords = "Atomic force microscopy, Magnetron sputtering, Optical parameters, PEDOT:PSS, Spectroscopic ellipsometry, X-ray diffraction, ZnO",

author = "M. Garganourakis and S. Logothetidis and C. Pitsalidis and D. Georgiou and S. Kassavetis and A. Laskarakis",

year = "2009",

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doi = "10.1016/j.tsf.2009.02.100",

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T1 - Deposition and characterization of PEDOT/ZnO layers onto PET substrates

AU - Garganourakis, M.

AU - Logothetidis, S.

AU - Pitsalidis, C.

AU - Georgiou, D.

AU - Kassavetis, S.

AU - Laskarakis, A.

PY - 2009/10/1

Y1 - 2009/10/1

N2 - ZnO thin films of different thicknesses were deposited by pulsed direct-current magnetron sputtering onto poly(ethylene terephthalate) (PET) substrates and afterwards poly 3, 4-ethylenedioxythiophene:polystyrenesulfonate (PEDOT:PSS) was spin-coated onto the ZnO film. Spectroscopic ellipsometry in the Vis-fUV energy range (1.5-6.5 eV), X-ray diffraction and atomic force microscopy were used to reveal the properties of the deposited films. The size of crystallites increased from 5.1 to 7.4 nm, whereas the crystallinity of the ZnO films has been improved. The influence of different ZnO thickness on the optical properties of the PEDOT:PSS layer was studied as well. As the thickness of ZnO films increased, the surface roughness increased but the energy gap decreased after a critical thickness. Concerning the consequences to the PEDOT:PSS optical properties, no major changes occurred in the transition energies.

AB - ZnO thin films of different thicknesses were deposited by pulsed direct-current magnetron sputtering onto poly(ethylene terephthalate) (PET) substrates and afterwards poly 3, 4-ethylenedioxythiophene:polystyrenesulfonate (PEDOT:PSS) was spin-coated onto the ZnO film. Spectroscopic ellipsometry in the Vis-fUV energy range (1.5-6.5 eV), X-ray diffraction and atomic force microscopy were used to reveal the properties of the deposited films. The size of crystallites increased from 5.1 to 7.4 nm, whereas the crystallinity of the ZnO films has been improved. The influence of different ZnO thickness on the optical properties of the PEDOT:PSS layer was studied as well. As the thickness of ZnO films increased, the surface roughness increased but the energy gap decreased after a critical thickness. Concerning the consequences to the PEDOT:PSS optical properties, no major changes occurred in the transition energies.

KW - Atomic force microscopy

KW - Magnetron sputtering

KW - Optical parameters

KW - PEDOT:PSS

KW - Spectroscopic ellipsometry

KW - X-ray diffraction

KW - ZnO

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DO - 10.1016/j.tsf.2009.02.100

M3 - Article

AN - SCOPUS:68349154731

SN - 0040-6090

VL - 517

SP - 6409

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JO - Thin Solid Films

JF - Thin Solid Films

IS - 23

ER -

Deposition and characterization of PEDOT/ZnO layers onto PET substrates

Abstract

Keywords

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