Degradation testing and failure analysis of DC film capacitors under high humidity conditions

Huai Wang, Dennis A. Nielsen, Frede Blaabjerg

    Research output: Contribution to journalArticlepeer-review

    49 Scopus citations

    Abstract

    Metallized polypropylene film capacitors are widely used for high-voltage DC-link applications in power electronic converters. They generally have better reliability performance compared to aluminum electrolytic capacitors under electro-thermal stresses within specifications. However, the degradation of the film capacitors is a concern in applications exposed to high humidity environments. This paper investigates the degradation of a type of plastic-boxed metallized DC film capacitors under different humidity conditions based on a total of 8700 h of accelerated testing and also postfailure analysis. The test results are given by the measured data of capacitance and the equivalent series resistance. The degradation curves in terms of capacitance reduction are obtained under the conditions of 85% Relative Humidity (RH), 70% RH, and 55% RH. The postfailure analysis of the degraded samples of interest is also presented. The study enables a better understanding of the humidity-related failure mechanisms and reliability performance of DC film capacitors for power electronics applications.

    Original languageBritish English
    Pages (from-to)2007-2011
    Number of pages5
    JournalMicroelectronics Reliability
    Volume55
    Issue number9-10
    DOIs
    StatePublished - Aug 2015

    Keywords

    • Film capacitors
    • Power electronics
    • Reliability

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