Degradation Analysis of Planar Magnetics

Zhan Shen, Qian Wang, Huai Wang

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    8 Scopus citations

    Abstract

    This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are an-alyzed. Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.

    Original languageBritish English
    Title of host publicationAPEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages2687-2693
    Number of pages7
    ISBN (Electronic)9781728148298
    DOIs
    StatePublished - Mar 2020
    Event35th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2020 - New Orleans, United States
    Duration: 15 Mar 202019 Mar 2020

    Publication series

    NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
    Volume2020-March

    Conference

    Conference35th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2020
    Country/TerritoryUnited States
    CityNew Orleans
    Period15/03/2019/03/20

    Keywords

    • degradation
    • lifetime model
    • magnetic core
    • Planar transformer
    • reliability
    • winding

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