@inproceedings{5dca562908ca48cf9a790141f49ad622,
title = "Degradation Analysis of Planar Magnetics",
abstract = "This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are an-alyzed. Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.",
keywords = "degradation, lifetime model, magnetic core, Planar transformer, reliability, winding",
author = "Zhan Shen and Qian Wang and Huai Wang",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 35th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2020 ; Conference date: 15-03-2020 Through 19-03-2020",
year = "2020",
month = mar,
doi = "10.1109/APEC39645.2020.9124586",
language = "British English",
series = "Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2687--2693",
booktitle = "APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition",
address = "United States",
}