Abstract
〈100〉-, 〈110〉- and non-textured polycrystalline diamond films deposited by microwave plasma enhanced chemical vapour deposition (MPCVD) have been used for the fabrication of resistive photoconductors. Such detectors can be used to measure the intensity and the temporal shape of pulsed radiation such as IR, visible, UV and X-ray. The photodetectors were characterised under fast pulsed Nd:Yag laser radiation (λ = 266, 532 and 1064 nm, 30 ps FWHM) and steady state X-ray (40 keV). Detector pulsed signals having FWHM in the range 350-600 ps were obtained. Film texture and nitrogen concentration in the film are found to have a significant influence on the detector response time and on carrier lifetime.
| Original language | British English |
|---|---|
| Pages (from-to) | 732-736 |
| Number of pages | 5 |
| Journal | Diamond and Related Materials |
| Volume | 5 |
| Issue number | 6-8 |
| DOIs | |
| State | Published - May 1996 |
Keywords
- CVD diamond film
- Photoconductor
- Radiation
- Texture