Correlation of high temperature x-ray photoemission valence band spectra and conductivity in strained LaSrFeNi oxide on SrTiO3 (110)

  • A. Braun
  • , X. Zhang
  • , Y. Sun
  • , U. Müller
  • , Z. Liu
  • , S. Erat
  • , M. Ari
  • , H. Grimmer
  • , S. S. Mao
  • , T. Graule

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Reversible and irreversible discontinuities at around 573 and 823 K in the electric conductivity of a strained 175 nm thin film of (La0.8Sr 0.2) 0.95 Ni0.2Fe0.8O3-δ grown by pulsed laser deposition on SrTiO3 (110) are reflected by valence band changes as monitored in photoemission and oxygen K -edge x-ray absorption spectra (XAS). The irreversible jump at 823 K is attributed to depletion of doped electron holes concomitant with reduction of Fe3+ toward Fe2+, as evidenced by oxygen and iron core level soft XAS, and possibly of a chemical origin, whereas the reversible jump at 573 K possibly originates from structural changes.

Original languageBritish English
Article number022107
JournalApplied Physics Letters
Volume95
Issue number2
DOIs
StatePublished - 2009

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