Abstract
This paper outlines the problems associated with testing analog and mixed-signal circuits. It discusses the failure modes and fault models used. It then proposes a go no go test method for analog circuits. The method is based on the excitation of the circuit-under-test with a pseudo random binary sequence and the subsequent analysis of the captured response. The fault detection capabilities of the test and data analysis methods are demonstrated by applying them to a continuous time filter circuit operating in the mid-band frequency range. An initial assessment of the impact of the input test sequence length on the detectability of faults is also discussed.
| Original language | British English |
|---|---|
| Pages | 119-122 |
| Number of pages | 4 |
| State | Published - 2004 |
| Event | Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference, MELECON 2004 - Dubrovnik, Croatia Duration: 12 May 2004 → 15 May 2004 |
Conference
| Conference | Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference, MELECON 2004 |
|---|---|
| Country/Territory | Croatia |
| City | Dubrovnik |
| Period | 12/05/04 → 15/05/04 |
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