Confession session: Lessons learned the hard way

Tobi Delbruck, Ibrahim M. Elfadel, Shahzad Muzaffar, Germain Haessig, Bo Wang, Amine Bermak, Rui Graca, Luis Camuñas-Mesa, Bathiya Senevirathna, Pamela Abshire, Saeed Afshar, Bernabe Linares-Barranco, Shih Chii Liu, Runchun Wang, Piotr Dudek, Stephen Carey, Jose de la Rosa, Marc Dandin, Sheung Lu, Vincent FrickTeresa Serrano-Gotarredona, Paula Lopez, Melika Payvand, Advait Madhavan, Eric Fossum, J. Camilo Vasquez Tieck, Ian Williams, Yan Liu, Timothy Constandinou, Alexander Serb, Ricardo Carmona-Galan, Robert Nawrocki, Walter D. Leon-Salas, Bernabe Linares-Barranco, Teresa Serrano-Gotarredona, Tobi Delbruck, Walter D. Leon-Salas

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


“Fail often to succeed sooner” is a common mantra that we are told is the secret to success. When reporting research results, however, scholars rarely write about their failed attempts and only focus on the successful ones. Perhaps the source of this disconnect between what we preach and what we do can be found in the underlying assumption that published work is meant to move the field forward and failed attempts supposedly do not. The goal of the confessions presented in this paper is to show that even failed attempts are genuine and valuable contributions to our field provided that we learn from our mistakes and correct them. The 27 confessions span from planning oversights, digital and analog design errors, misunderstanding of devices, overlooked parasitics, LVS errors, and troubles in testing.

Original languageBritish English
Title of host publication2020 IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728133201
StatePublished - 2020
Event52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Virtual, Online
Duration: 10 Oct 202021 Oct 2020

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310


Conference52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020
CityVirtual, Online


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