@inproceedings{7a7195edae1447b19358fc7ef7195273,
title = "Comparison of voltage and current testing of analogue and mixed-signal circuits",
abstract = "The author presents a time-domain testing technique for analogue and mixed-signal circuits. The circuit-under-test (CUT) is simulated by a pseudo-random-binary sequence (PRBS) signal and both the voltage and supply current (Iddq) responses are measured. Both measurements are subsequently analyzed to detect the presence of a fault and to establish which measurement achieves higher confidence in the detection. The technique can test mixed-signal circuits in a unified manner and detecting soft and catastrophic faults.",
author = "M. Al-Qutayri",
note = "Publisher Copyright: {\textcopyright} 1993 IEEE.; 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993 ; Conference date: 27-09-1993 Through 01-10-1993",
year = "1993",
doi = "10.1109/ASIC.1993.410829",
language = "British English",
series = "Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "156--159",
booktitle = "Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993",
address = "United States",
}