Charge effect of an isolated Gold Nanoparticle embedded in High-k oxide

A. Rezk, Y. Abbas, Irfan Saadat, A. Nayfeh, M. Rezeq

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The electrical characteristics of a single gold nanoparticle (Au-NP) embedded in high-k oxide on an-type Si (n-Si) substrate has been experimentally investigated. The Au NPs are sandwiched between two layers of amorphous Al2O3 thin film, grown using atomic layer deposition (ALD) method to form both a blocking and tunneling layer for charge confinement. The current-voltage (I-V) measurements were performed using a conductive atomic force microscope (CAFM) with a metal-coated nano-probe placed on a single isolated NP at a time. The results demonstrated the presence of charge confinement in the Au-NP originated from the nano-probe during the voltage sweep. This is evident from the hysteretic behavior of the I-V curve during the increase and decrease of the applied positive voltage on the substrate.

Original languageBritish English
Title of host publicationNANO 2020 - 20th IEEE International Conference on Nanotechnology, Proceedings
PublisherIEEE Computer Society
Pages24-28
Number of pages5
ISBN (Electronic)9781728182643
DOIs
StatePublished - Jul 2020
Event20th IEEE International Conference on Nanotechnology, NANO 2020 - Virtual, Online, Canada
Duration: 29 Jul 202031 Jul 2020

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume2020-July
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Conference

Conference20th IEEE International Conference on Nanotechnology, NANO 2020
Country/TerritoryCanada
CityVirtual, Online
Period29/07/2031/07/20

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