Characterization techniques for advanced research

Research requires characterization techniques for developing new advanced materials with novel properties and widespread applications in the desired field, especially in nanomaterials such as mesoporous silica nanoparticles (MSNs) for biomedical, drug delivery, catalysis, and sensing applications. Nanomaterials require advanced techniques to determine chemical (composition, surface characterization, mass and/or particle number concentration, presence of impurities) and physical information (e.g., size, size distribution, shape, surface area, aggregation, crystal structure) to ensure the properties, composition, and success of the synthesis before using nanostructured materials in different applications. Such information can only be obtained through measurement or examination using advanced characterization techniques. Therefore, this chapter explores different cutting-edge techniques related to MSNs characterization. Scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), Confocal Laser Scanning Microscopy (CLSM), Brunauer-Emmett-Teller (BET) technique, dynamic light scattering (DLS), and small-angle X-ray scattering (SAXS) are explained for morphological analysis of the materials. For compositional analysis, Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS), Energy dispersive X-ray spectroscopy (EDX), Auger electron spectroscopy (AES), mass spectroscopy, Raman spectroscopy, and secondary ion mass spectroscopy (SIMS) have been discussed. In addition to these techniques, characterization techniques for determining different materials' thermal, electrical, and magnetic properties have also been explored. This chapter explains all the advanced techniques using MSNs as nanomaterials, emphasizing the need for advanced techniques in confirming the success and properties of MSNs.